Machine-Learning Breakthrough That Opens Way to Edge Learning
The machine learning technique overcomes past barriers to developing intelligent RRAM-based edge-learning systems Scientists from CEA-Leti have demonstrated a machine-learning technique that assists in the development of resistive-RAM (RRAM)-based edge-learning intelligent systems. The learning algorithms currently used in RRAM-based edge approaches cannot meet with device programming randomness, or variability, as well as other intrinsic non-idealities […]
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